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SEEC Microscopy system

 

SEEC Microscopy is a new technique that increases the sensitivity of any reflected light microscope. It is based on the use of contrast-enhancing sample substrates - called Surfs (think of them as high-tech microscope slides). SEEC Microscopy is routinely capable of:

                  ·        Providing the most contrasted images light microscopy can offer ;  

                  ·        Visualizing and measuring mono layers;        

                  ·        Locating nano-objects.

      Nanolane supplies:

                    ·        Different kinds of Surfs, depending on your applications;

     ·        Solutions to upgrade your microscope to perform SEEC microscopy as well as mapping capable;

    ·        All-in-one, dedicated imaging and 3D-mapping stations.

 

 Let us open your eyes to the nanoworld!

 

 surf  surf2  surf3
Imaging Solution  Measurement Solution Stand Alone Solution
 SURFs
 SARFUS Mapping Lite  SARFUS Mapping Station

                                                    

 

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