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Sarfus HR Station and LR Station

 

Sarfus HR Station

product sarfus mapping 01

Based on high-quality optical devices, the SARFUS HR station is the high-resolution SEEC system. Imaging and topographic analyses of samples down to the nanoscale can be performed in dry and in liquid. High-quality images and accurate data acquistion are offered with this robust and calibrated optical system. The Sarfus HR station enables measurement with a Z-limit of detection down to 0.1nm and an accuracy better than 0.3nm in dry and 0.2nm in liquid.

Many options are available for the Sarfus HR station: motorized stage, autofocus, fluorescence, confocal... mode.

Main features
Product Sarfus Mapping 04
  • Flexible mode of analysis
    Work in static or dynamic mode in air or in water. Track changes vs. time, T°, pH, [C]...
     
  • High-resolution imaging
    Access to high-resolution and direct imaging of your samples thanks to the sub-micrometric lateral sensitivity (down to 300nm)
     
  • High-sensitivity analysis
    Detect mass or structural changes with a sub-nanometric sensitivity (down to 0.1nm or 1ng/cm²).
     
  • Access to sample topography
    Perform complete topographic studies (thickness, roughness, 3D view...) with high-accuracy (down to 0.2nm).
  • Real-time analysis
    With up to 90 frames/second, perform precise 2D and 3D kinetic studies of morphological changes/phase transition. 
  • Label-free technique
    Preserve your samples, no need to label and thus no risk for photobleaching/photoquenching...
Main applications
Product Sarfus Mapping 03
  • Live visualization of nanolayer, biofilm, biochip, ...
  • Topographic analysis of nanometric films and patterns.
  • Real-time study of molecular adsorption and desorption.
  • Real-time study of (bio)films build-up and degradation.
  • Kinetics studies of film morphological change vs. time, T°, ...
  • Control of the homogeneity of thin films/patterns.
  • Visualization of the nano-objects dispersion.
  • Live visualization of nano-objects/biological layers interaction.
  • Visualization of vesicles spreading on surface.
  • Characterization of swelling effect.
  • Studies of extra-cellular matrix.

 SARFUS LR Station

The SARFUS LR Station is an entry-level system dedicated to routine analysie in dry. Imaging and topographic characterization of nanometric samples are  . The system offered Z-limit of detection better than 2nm and measurement accuracy better than 2nm.

The SARFUS LR Station is the perfect tool for rapid and precise analyses for samples with thickness higher to 2nm. Nanometric films, nanopatterns, Langmuir-Blodgett films, liquid crystal and coating  are some exemples of samples studiable by the Sarfus LR stations

  • Flexible mode of analysis
    Work in static or dynamic mode in air. Track changes vs. time, T°...
     
  • High-resolution imaging
    Access to high-resolution and direct imaging of your samples thanks to the sub-micrometric lateral sensitivity (down to 300nm)
     
  • High-sensitivity analysis
    Detect mass or structural changes with a sub-nanometric sensitivity (down to 2 nm or 5 ng/cm²).
     
  • Access to sample topography
    Perform complete topographic studies (thickness, roughness, 3D view...) with high-accuracy (down to 2 nm).
  • Real-time analysis
    With up to 90 frames/second, perform precise 2D and 3D kinetic studies of morphological changes/phase transition. 
  • Label-free technique
    Preserve your samples, no need to label and thus no risk for photobleaching/photoquenching...

Product Sarfus Imaging 05 
 

 

 

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